电子镇流器故障分析

电子镇流器故障分析

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时间:2018-07-15

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1、电子镇流器故障分析Commonfailureanalysisofelectronicballast.AquoteElectronicballastisanewtypeofhighvoltage(220v),ba(microelectronics)andelectricvacuum,opticaltechnologyasoneofthehigh-techenergy-savingelectronicproducts,electriclightsourcecomparedwithtraditionalballast,en

2、ergysaving,lowstartingvoltage,highpowerfactor,lowtemperaturerise,nostroboscopic,nonoiseandextendingtheservicelifeofthetube,hasbeenwidelyusedinfluorescentlamps,metalhalidelamp,sodiumlamp,neonlights,andotherproducts,itsmarketshareincreasedyearbyyear,hasatendencyt

3、oreplacethetraditionalballast.However,morethan80%oftheelectronicballastproductsmanufacturedinChinaadoptthehalf-bridgeinvertercircuitwhichconsistsofdiscretecomponents,andmorethan70%oftheperformanceispoor.Domesticproductionenterprisesofelectronicballastsasmanyas4

4、00-500,thereareanumberofproductionunitswithsmallscale,lowoutput,lackofnecessarytestingmeansandqualitycontrolequipment,improperselectionofcomponentsandwithoutstrictscreening,usedcomponentsconsistencyispoor,theperformanceisnotstable,adirectimpactontheoverallquali

5、tyofelectronicballasts.Suchasworkinglife,powerfactorandharmoniccontent,thereisstillalargegapcomparedtotheinternationalwell-knownbrands.Thecommonfailureanditsfailuremechanismoftheelectronicballastproducts,putforwardthecorrespondingimprovementmeasures,improvetheq

6、ualityofelectronicballastproducts,isanimportantresearchsubject.2failuremechanismanalysisThebasicfunctionofelectronicballastistoconvert50Hzpowersupplyto20~50kHz'shighfrequencypowersupply,anddirectlylightupthedaylightlamptube.Atpresent,themostwidelyusedelectronic

7、ballastseriesresonantcircuit,thecircuitbytherectifierfiltercircuit,powerswitchcircuitanddrivercircuit,ballastandfilamentloadofthreeparts.Shortlifeofdomesticelectronicballasts,consistency,andthecauseofthepoorreliabilitypoorexceptforcircuitdesign,ballastandlampba

8、dmatchingandpowervoltagefluctuationbigfactors,suchascomponentparametersofreliabilityandconsistencyispoor,isalsoanimportantreason.Althoughtheresultsoftheinvestigationofelectr

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